The Terascope from the Helmut Fischer Group enables the layer thickness measurement of organic single and multiple layers on any base material with terahertz. Up to seven layers can be analyzed in detail within a few seconds and with just one measurement. With a bandwidth of up to 6THz and in combination with the patented Clean Trace technology and a sampling rate of 1.6 kHz, measurement recording is quick and reliable, even in harsh environments. The compact measuring head positions itself optimally to the measurement object using an optional 3D scanner. This means that curved and complex shaped surfaces as well as wet and soft layers can also be measured.
