Inline White-Light Interferometer
Bild: Polytec GmbH

With a height measurement range of 400µm, the microscope-based system with its high lateral resolution is suited for precise inline roughness measurement. Scanning is performed in real time using complex algorithms on graphics cards. If the image field is reduced, the frame rate can be accelerated down to 3kHz. Since the inline measuring system is compact, it can be easily integrated into the production line. The measuring head can also be mounted separately like a sensor and thus positioned flexibly. 3D measurement data can be processed with any suitable evaluation software. Alternatively, the TMS software developed for Polytec topography measuring systems offers numerous options for evaluating the measurement results quickly and in compliance with ISO, thus turning complex surface analyses into simple one-click solutions.

Polytec GmbH