Hamamatsu’s HyperGauge Thickness measurement system C17319-11 employs a spectroscopic interference method for precise film thickness measurement. Equipped with the -Capture technology, which detects wavelength shifts using high-sensitivity cameras without a spectrometer, it can measure the entire film thickness of up to 300mm wafers in as little as five seconds.
Neurocle is showcasing versions 5.0 of Neuro-T and Neuro-R, the highlight of which is a VLM-based ‘Prompt Labeler.’
OptoMedia’s ultra-compact Mini SFF brings reliable, high-speed fiber connectivity to next-generation industrial cameras.
The IRSX-2 from AT Sensors combines intelligent temperature monitoring and analysis within a fully standalone IR camera.
Ximea unveiles two new camera platforms. The MX1048 is based on Sony’s 105MP IMX927 sensor, which shoots directly to host…
With evopro’s platform-independent, open software platform Visionwebx, vision applications are developed once and deployed across any target system.
OptoMedia’s ultra-compact Mini SFF brings reliable, high-speed fiber connectivity to next-generation industrial cameras.
