Optische Messtechnik
-
Digital Holographic Sensors for High-Precision 3D in Motion
With HoloTop Motion, Fraunhofer IPM presents digital holographic sensors for high-precision 3D measurement of moving surfaces.
-
Confocal Sensor with 2,624 Measurement Points
The confocalLine CLI8500 from Micro-Epsilon combines the advantages of confocal sensors with intelligent 3D scanning technology.
-
Wafer thickness distribution in 5sec
Hamamatsu’s HyperGauge Thickness measurement system C17319-11 employs a spectroscopic interference method for precise film thickness measurement.
-
Portable Photometric Stereo Inspection
AIT Austrian Institute for Technology Photodex is the first portable inspection system to combine motion-robust photometric stereo, high-resolution surface inspection, CAD-based defect localization and AI-ready annotation in a single industrial…
-
OPC UA for High Precision Laser Measurement
Hexagon introduced OPC UA support in SpatialAnalyzer, its software for large-scale metrology and alignment.
-
Coherence Scanning Interferometry at 2.57kfps
The SmartWLI Firebolt2 from GBS is based on white-light interferometry – or coherence scanning interferometry – and achieves a frame rate of 2.57kfps at a resolution of 2,048×1,216px, thanks to…
-
Measuring Complex Workpieces with 5-Axis Multisensor technology
Dr. Heinrich Schneider Messtechnik presents the PMS 600 3D multisensor coordinate measuring machine in a 5-axis version featuring an advanced multisensor measuring head, enabling the measurement of complex workpieces even…
-
Digital Holographic Sensor for CMM
Digital multi-wavelength holography enables the rapid, highly accurate, and area-wide measurement of surface topographies.
-
Smart 2D Profile Sensors
Baumer’s OX series smart 2D profile sensors analyze height profiles using an integrated and further expanded toolset, enabling cost-effective solutions for a wide range of demanding inspection and positioning tasks.
-
Surface Measurement via Reflection Patterns
At the heart of Opto’s solino surface measurement system lies a computer-aided imaging approach.














