Metrologie & NDT
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Image: ResoniksAI-Powered Acoustic Testing
Through AI-powered acoustic testing, manufacturers can use Resoniks’ QCFlex to perform 100% inspection of complex parts.
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Image: Lumafield HeadquartersVery Fast Volumetric CT Reconstructions
Lumafield announced Neptune Performance and Triton Performance, a new tier of high-performance industrial X-ray CT scanning solutions that connects metrology-grade measurement in the engineering lab directly to automated, production-speed inspection…
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Image: OptoMedia TechnologyFiber Mini SFF for GigE Vision
OptoMedia’s ultra-compact Mini SFF brings reliable, high-speed fiber connectivity to next-generation industrial cameras.
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Image: Mitutoyo Deutschland GmbHHigh-Resolution Measuring Probes
With a measuring force of just 0.01N, the Litematic VL-50-B (or 50S-B) probe is ideal for measuring the thickness or height of workpieces that are easily affected by measuring force.
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Image: BAM Bundesanstalt für MaterialforschungUniquely Identifying Additive Parts
Secure identification and authentication of components is also gaining importance in additive manufacturing.
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Image: Wenzel Group GmbH & Co. KGCombination of Coordinate and Gear Metrology
The 4-axis LH Hybrid measuring system from Wenzel, which combines high-precision gear metrology with the versatility of a traditional CMM in a single device, will celebrate its premiere at the…
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Image: Mitutoyo Deutschland GmbHRoughness and Contour Measurement in a Single Detector
The new model in Mitutoyo’s Formtracer Avant series, the FTA-H3000, seamlessly combines roughness and contour measurement in a single detector.
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Image: RWTH AachenSub-Micrometer Accuracy in CT
One of the CactuX product lines, calibration Phantoms, strives to push the boundaries of precision in industrial CT.
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Image: Volume Graphics GmbHSplitting Multi-Part CT Scans
One of the highlights of the new Volume Graphics software version 2024.4 is the Split Volume tool, which is splitting multi-part CT scans.
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Image: Shimadzu Deutschland GmbHCT Table Device with 100µm Resolution
The XSeeker 8000 computer tomograph from Shimadzu fits on a table and has a 160kV X-ray source and a high-resolution detector.
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Image: Comet Yxlon GmbHFully automated Sub-Micron X-Ray Inspection
By combining high-resolution 3D X-ray and automated 3D metrology for CoS (chip-on-substrate) solder connections, the Comet Yxlon CA20 enables manufacturers to identify and eliminate systematic yield issues faster than ever…
