News
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Image: Carl Zeiss AGPowerful Xray-/CT-Data Software
The newest features of Zeiss Inspect X-Ray 2025 software is now available as part of the Zeiss Quality Suite.
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Image: Inno-Spec GmbHHyperspectral Imaging in the UV Range
Traditionally, HSI systems have been limited to the VNIR and SWIR regions.
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Image: TeDo Verlag GmbHExtreme Fast Waver Inspection
Precitec Optronics Flying Spot Scanner 310 combines OCT measurements with a large measuring field.
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Image: Opto Engineering S.p.A.Inspection from Inside with Liquid Lenses
Opto Engineering’s PCBP probes are used to inspect hollow objectsdown to 5.5mm whose hidden features can only be controlled by introducing a probe into the cavity.
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Image: Edgehog Advanced Technologies Inc.Omnidirectional Anti-Reflection CMOS Coverglass
Traditional anti-reflective coatings help reduce flare by creating destructive interference to cancel out light reflections.
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Image: Micro-Epsilon Messtechnik GmbH & Co. KGPrecise Laser Distance Sensor
The special feature of the OptoNCDT ILR3800-100 laser distance sensor from Micro-Epsilon is the high signal stability and precision on different surfaces.
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Image: Excelitas Technologies Corp.VIS-NIR Lens Series
Excelitas Linos inspec.x L 5.6/105 VIS-NIR lens series is for visual and non-visual inspection.
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Image: PropheseeStructured Light Embedded System with 500Hz
Prophesee Metavision EVK3D is a very fast structured light embedded system.
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Image: Shimadzu Deutschland GmbHCT Table Device with 100µm Resolution
The XSeeker 8000 computer tomograph from Shimadzu fits on a table and has a 160kV X-ray source and a high-resolution detector.
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Image: Mitutoyo Europe GmbHWhite Light Interference Optical Unit
The WLI Units 03/05/10 from Mitutoyo enable high-precision measurements of fine surface textures such as 3D shape or 3D roughness measurements using white light interference.
