Nikon Metrology’s Nexiv VMF-K series enhances traditional measurement systems by employing an advanced confocal optical system. The series addresses the challenges posed by complex sample geometries – including high-contrast surfaces and transparent materials – enabling users to capture detailed measurements that were previously challenging to obtain. The series combines 2D and height measurements in one device, achieving 1.5 times higher throughput than previous models. Its confocal optical system enables simultaneous 2D and height measurements within the FoV, reducing measurement time without compromising precision.
