EMVA Forum at Control 2020
In 2020, the European Machine Vision Association EMVA, together with the trade journal inVISION and the trade fair organiser P.E.Schall, will organise the Control Vision Talks – Forum for Optical Metrology and Machine Vision – for the fifth time at the Control fair (May 5 to 8, 2020, Stuttgart). You will have the opportunity to give a free 20-minute lecture on one of the following topics: a) 3D image processing, b) optical metrology, c) CT & X-ray or d) spectral imaging (from SWIR to hyperspectral). Please send your abstract (up to 2,000 characters) and the title of your presentation by email to firstname.lastname@example.org. The deadline for submitting your abstract is 27 January 2020.