Bruker Alicona’s new CMM Neo optical coordinate measuring machine achieves a measurement speed up to twice that of the first generation. At the same time, axis accuracy has been further improved and now stands at EUni:Tr:ODS,MPE – (0.7 + L/600) m (L in mm). This is based on a newly developed industrial architecture featuring wear-free axes. A further advantage of the device lies in the integration of multiple measurement methods within a single system. Advanced Focus-Variation, Vertical Focus Probing, Focus Probing, and Real3D enable dimensional, form, position, and surface analyses without the need to switch systems.
