Optische Messtechnik
-
Image: Visometry GmbHCAD-Based Inspection of Small Objects
Visometry’s AR tool Twyn 2.5, which enables CAD-based visual inspections via iPad, boasts new features.
-
Image: SensofarCreate, Customize & Automate Analyses
Sensofar introduces Sensopro 5, the new version of its surface analysis software.
-
Image: Micro-Epsilon Messtechnik GmbH & Co. KGConfocal chromatic high-temperature sensors
With the confocal chromatic high-temperature sensors confocalDT IFS2407-xHT/VAC, Micro-Epsilon presents its first optical sensors capable of measuring with the highest accuracy at ambient temperatures up to +200°C.
-
Bild: Mahr GmbHMobile Surface Metrology Directly on the Component
The new generation of Mahr’s MarSurf CM mobile combines the system’s existing features with the HDR functionality of the stationary systems and was developed for measurements on large objects, such…
-
Bild: Micro-Epsilon Messtechnik GmbH & Co. KGSurface Inspection Version 3.0
Micro Epsilon’s 3DInspect software tool is now available in version 3.0.
-
Image: Protos-3D Metrology GmbHVirtual Clamping for Larger Components
The Protos 3D virtual clamping fixture Prafs 3620 (standard 3-point support) is now also available as a 4-point and 6-point support for large sheet metal components (front panels, roofs, and…
-
Image: Baumer GmbHCompact Time-of-Flight Sensors
With the OT200, Baumer has developed one of the most compact time-of-flight sensors, featuring a small blind spot (
-
Image: Werth Messtechnik GmbHOperator-Independent Optical Measurements
The EasyScope IP Manual from Werth Messtechnik offers operator-independent optical measurements with the newly developed EasyScope SolidState Zoom.
-
Image: AOI Airon UGUltra-Fast Chromatic Confocal Sensor Controller
Tronsight’s / Airon’s TS-CP Series ultra-fast chromatic confocal sensor controller ensures highly stable and reliable measurement processes.
-
Image: Micro-Epsilon Messtechnik GmbH & Co. KGHigh-Precision Inline Measurement of Thin Films
The white-light interferometers of the IMS5200-TH series from Micro-Epsilon are used for nanometer-precise film thickness measurements from 1 to 100µm with a linearity of
