From now on, the white light interferometers of the interferoMETER series by Micro-Epsilon are also available as multipeak systems. The new versions now also enable the high-precision detection of transparent layers. Depending on the controller model, this is done via calculations from the respective distance values and taking into account the refractive indices. The thickness measurement system does not take distance measurements, it measures the thickness of the individual layers and their combinations. The systems offer a resolution of up to <30 picometers.
