From now on, the white light interferometers of the interferoMETER series by Micro-Epsilon are also available as multipeak systems. The new versions now also enable the high-precision detection of transparent layers. Depending on the controller model, this is done via calculations from the respective distance values and taking into account the refractive indices. The thickness measurement system does not take distance measurements, it measures the thickness of the individual layers and their combinations. The systems offer a resolution of up to <30 picometers.
In the combination of resolution and speed, the 3D sensors of the C6-3070 series by AT Automation Technology impress with the new WARP technology (Widely Advanced Rapid Profiling).