At Formnext, IBS Quality, together with Verisurf Software, Aesub and Eleven Dynamics, will present the complete 3D scanning process chain with the PAM system, a mobile scanning and inspection solution complemented by an intelligent software concept. Especially the offline programming on a digital twin makes the system interesting. The highlight of the measurement demo is that, for the first time, spraying with the scanning spray from Aesub is also carried out automatically by the robot before the scanning process begins.
12″ Wafers Inspection in Single Scan
For bow, warp, TTV and quality inspection of semiconductor wafers in shorter cycle times Precitec has launched the ultra-fast Flying Spot Scanner (FSS) 310. Its features include flexible scan trajectories, the ability to measure 12″ wafers and a Z resolution in the nm range.