High Resolution OCT for Layer Thickness Measurements

Image: Fraunhofer-Institut IPT

In the project ifSidLa – development of a method for interferometric layer thickness measurement of thin, printed coating films – the Fraunhofer IPT has created a high-resolution OCT measurement system based on interferometry, which can be used to reliably measure thin transparent coating layers. Due to its flexible design, the system can also be integrated into production or an application machine. It consists of a light source with a spectral bandwidth of about 300nm. This allows individual layers of a sample to be examined and layer thicknesses of up to one micrometer to be measured. The OCT system can be seen at the Control Messe.

Fraunhofer-Institut IPT