Neuheiten
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SWIR Line-Scan Cameras with Pixel Shift
JAI is expanding its Wave Series with two SWIR GigE Vision line-scan cameras featuring 12.5×12.5µm pixels.
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AI-Inspections with iPhone
A new vision system from Enao Vision enables quality control using iPhone and AI vision.
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Mobile Surface Metrology Directly on the Component
The new generation of Mahr’s MarSurf CM mobile combines the system’s existing features with the HDR functionality of the stationary systems and was developed for measurements on large objects, such as rollers and car bodies.
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