The white-light interferometers of the IMS5200-TH series from Micro-Epsilon are used for nanometer-precise film thickness measurements from 1 to 100µm with a linearity of <±100 nm. With a measurement rate of up to 24kHz, they are ideal for dynamic measurement tasks. Multi-peak measurements of up to five thin films are also possible. The sensor and controller are factory-aligned and calibrated, enabling nanometer-precise air gap and film thickness measurements.
Werth EasyScope multi-sensor coordinate measuring machines are now available in three versions.
Lucid Vision launched the Atlas10 SWIR, a 10GigE camera with RDMA support featuring Sony’s 5.2 MP IMX992 and 3.2 MP IMX993 SenSWIR InGaAs sensors with integrated thermoelectric cooling…
Espros Photonics introduces the EPC670 Starter Kit, a ready-to-use 3D depth evaluation platform built around the EPC670 ToF sensor and a Raspberry Pi 5 host system.
Teledyne e2v introduces the Perciva 5D camera, which generates 2D and 3D data from a single CMOS sensor.
Anticipate’s Fluidworks delivers a production-ready, scalable AI-powered evaluation solution – including operator guidance and analytics – for adhesive seam inspection.
