The new version of Artec Studio 17 (AS17) 3D scanning software enables advanced functionality for quality inspection, reverse engineering and full-color CGI workflows. Scan-to-CAD features and tools allow an object to be scanned and fully reconstructed within a single piece of software. The Auto-Surface tool enables one-click conversion of complex organic shapes into solid CAD models.
The optoNCDT 1760-1000 long-range laser sensor by Micro-Epsilon also measures at distances of up to 2m with up to 7.5kHz.
The Absolute 3D laser scanner AS1-XL by Hexagon is designed for inspecting large surfaces and can be used with both the laser tracker and mobile measuring arms.
As part of the joint project ‘Dynamic-holographic measurement method for recording metallic free-form surfaces (HoloMotion)’, Fraunhofer IPM was able to show that digital-holographic measurements are also possible on moving test objects.
Foreign objects in the plastic melt are a problem in extrusion.
Dr. Heinrich Schneider Messtechnik presents the WMX 600 optical shaft measuring machine with the Quick Detect (QD) function.
Install the sensor, scan the object, visualize and evaluate measurement data, all of this can be done in just ten minutes with the new MetrologyPackage from AT Automation Technology.
ICP Germany offers the E310-10EHI-J6413, a fanless embedded system that can be used for inference systems and industrial control thanks to Hailo-8TM AI IC.
Midwest Optical’s SK100 Filter Test Kit contains 70 filters for UV, VIS and NIR imaging, making it ideal for testing and evaluating image quality.
Engineered to optimize machine vision systems operating at high speeds, Smart Vision Lights ‘Hidden Strobe’ is a solution to the prevalent issue of distracting and disorienting LED strobe lights.
The Keyence VS model series enables quick problem solving for a variety of testing applications thanks to smart hardware architecture.
The IVS 108 of Leuze’s Simple Vision series detects present or absent objects.
Imec demonstrates successful incorporation of a PPD structure in the readout circuit of thin-film-based image sensors; the first of its kind.
