Neuheiten Lösungen
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Image: Jenoptik Industrial Metrology Germany GmbHInspecting Visual Surface Defect
Hommel Etamic’s Visoline system for inspecting visual surface defects such as pores, blowholes, and scratches features optional shape-from-shading, which analyzes surface structures and enables precise detection and classification of defects,…
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Image: Waygate TechnologiesFlexible Digital X-Ray Detector
Waygate (www.bakerhughes.com) presents the DXR Flex flexible digital X-ray detector.
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Image: Visometry GmbHAR Object Inspection with Deviation Detection
At Control, Visometry will showcase Twyn 2.4, its latest tool for rapid visual quality inspection using augmented reality object inspection via tablet.
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Image: Protos-3D Metrology GmbHVirtual Clamping for Parts up to 1,400mm
The PolyRobotAutomatedFixtureSystem (PRAFS) from Protos-3D replaces conventional, rigid fixtures with flexible, digitally controlled robot supports in the Zeiss ScanBox.
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Image: Fraunhofer Institute for Nondestructive Testing IZFPVisualize Properties and Defects in Steel
Fraunhofer IZFP (www.izfp.fraunhofer.de) will present a demonstrator that visualizes properties and defects in steel components at control Messe.
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Image: Wenzel Group GmbH & Co. KGCombination of Coordinate and Gear Metrology
The 4-axis LH Hybrid measuring system from Wenzel, which combines high-precision gear metrology with the versatility of a traditional CMM in a single device, will celebrate its premiere at the…
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Image: Teledyne FlirSynchronization of High-Speed Thermal Images
The Flir Mix system captures and synchronizes high-speed thermal and visible images at up to 1,004 fps.
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Image: IFM Electronic GmbH2D/3D AI Camera for Person Detection
Thanks to a high-performance processor, 2D/3D sensor data can be processed and merged directly in the sensor of IFM’s O3M AI collision warning system for mobile machines.
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Image: Hamamatsu Photonics Europe GmbHCompact FT-NIR Spectrometer
The Fourier Transform Near-Infrared Spectrometer (FT-NIR) C16511-01 from Hamamatsu combines FT techniques in a compact and fast device.
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Image: Micro-Epsilon Messtechnik GmbH & Co. KGConfocal Chromatic Controllers
Two new confocal chromatic controllers for high-precision distance and thickness measurement expand the Micro-Epsilon product portfolio.
